Items where Author is "Richardson, Andrew M. D."

Journal Article

Richardson, Andrew M. D. and Bunyan, R. and Mathias, H. and Nouet, P. (2007) Sensor Testing Through Bias Superposition. Sensors and Actuators A: Physical, 136 (1). pp. 441-455. ISSN 0924-4247

Richardson, Andrew M. D. and Bailey, Chris and Dumas, Norbert and Yannou, Jean Marc (2007) System in Package Technology - Design for Manufacture Challenges. Circuit World, 33 (1). pp. 36-46.

Richardson, Andrew M. D. and Mir, S. and Cheng, T. (2006) Guest editorial. Journal of Electronic Testing, 22 (4-6). p. 311. ISSN 0923-8174

Richardson, Andrew M. D. and Ferraris, Eleonora and Fassi, Irene and De Masi, Biagio and Rosing, Richard (2006) A capacitance and optical method for the static and dynamic characterization of micro electro mechanical systems (MEMS) devices. Microsystem Technologies, 12 (10-11). pp. 1053-1061. ISSN 0946-7076

Richardson, Andrew M. D. and Pickering, C. and McNie, M. and Reeves, C. L. (2006) INTEGRAMplus : a new European service project providing development platforms for integrated micro-nano technologies and products. MST News (VDI/VDE Technologiezentrum Informationstechnic). ISSN 0948-3128

Richardson, Andrew M. D. and Solomon, P. and El-Fatatry, A. (2006) MNT needs methodologies and software tools. MST News (VDI/VDE Technologiezentrum Informationstechnic), 2. pp. 16-35. ISSN 0948-3128

Jeffery, Carl and Cutajar, Rueben and Richardson, Andrew M. D. and Prosser, Steve and Lickess, M. and Riches, Steve (2005) The integration of on-line monitoring and reconfiguration functions into a safety critical automotive electronic control unit. Journal of Electronic Testing, 21 (4). pp. 405-416. ISSN 0923-8174

Jeffery, Carl and Zhou, Xu and Richardson, Andrew M. D. (2005) Using bias superposition to test a thick film conductance sensor. Journal of Physics: Conference Series, 15. pp. 161-166. ISSN 1742-6596

Lechner, A. and Burbidge, Martin J. and Richardson, Andrew M. D. (2004) Flexible embedded test solution for high-speed analogue front-end architectures. IEE Proceedings - Circuits, Devices and Systems, 151 (4). pp. 359-369. ISSN 1350-2409

Burbidge, Martin J. and Poullet, Frederic and Tijou, Jim and Richardson, Andrew M. D. (2003) Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs. Journal of Electronic Testing, 19 (4). pp. 481-490. ISSN 0923-8174

Burbidge, Martin J. and Lechner, A. and Richardson, Andrew M. D. (2003) Evaluation and detection of deterministic jitter causes in CP-PLLs due to macro level faults and pre-detection using simple methods. Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). pp. 157-164.

Burbidge, Martin J. and Tijou, Jim and Richardson, Andrew M. D. (2003) Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers. Journal of Electronic Testing. ISSN 0923-8174

Burbidge, M. and Richardson, Andrew M. D. (2001) Simple digital only test approach for embedded charge-pump phase-locked loops. Electronics Letters, 37 (22). pp. 1318-1319. ISSN 0013-5194

Contribution in Book/Report/Proceedings

Liu, Hongyuan and Strusevich, N. and Stoyanov, S. and Bailey, C. and Richardson, Andrew M. D. and Dumas, N. and Yannou, J. M. and Georgel, V. (2006) Modelling the behaviour of soldier joints for wafer level SIP. In: Proceedings of the 8th IEEE electronics packaging technology conference. :. UNSPECIFIED.

Georgopoulos, K. and Burbidge, M. and Lechner, A. and Richardson, Andrew M. D. (2005) Behavioural error injection, spectral analysis and error detection for a 4th order single-loop sigma-delta converter using Walsh transforms. In: Proceedings of the ETS workshop on Testing of High Resolution Mixed Signal Interfaces :. UNSPECIFIED.

Jeffery, C. and Bunyan, R. J. T. and Combes, D. and King, D. O. and Richardson, Andrew M. D. (2005) Design Considerations for On-line Testing of a Capacitive Accelerometer. In: Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop :. UNSPECIFIED, pp. 220-223.

Georgopoulos, K. and Burbidge, M. and Lechner, A. and Richardson, Andrew M. D. (2005) Investigation into the Use of Alternative Transformation Techniques for High-Resolution A/D Converter Testing. In: Proceedings of the IEEE Mixed Signal Test Workshop :. UNSPECIFIED.

Jeffery, C. and Cutajar, R. and Richardson, Andrew M. D. and Prosser, S. and Lickess, M. and Riches, S. (2005) The integration of on-line monitoring and reconfiguration functions using IEEE1149.4 into a safety critical automotive electronic control unit. In: Proceedings of Design, Automation and Test in Europe, 2005. :. UNSPECIFIED, pp. 153-158.

Burbidge, M. and Lechner, A. and Bell, G. and Richardson, Andrew M. D. (2004) Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops. In: IEE proceedings - circuits, devices and systems :. UNSPECIFIED, pp. 337-348.

Burbidge, Martin J. and Tijou, Jim and Richardson, Andrew M. D. (2003) Techniques for automatic on chip closed loop transfer function monitoring for embedded charge pump phase locked loops. In: Design, Automation and Test in Europe Conference and Exhibition, 2003 :. UNSPECIFIED, pp. 496-501. ISBN 0-7695-1870-2

Wang, C. and Richardson, Andrew M. D. and Liu, D. and Rosing, R. and Tucker, R. and De Masi, B. (2003) Construction of nonlinear dynamic MEMS component models using cosserat theory. In: Proceedings of the SPIE design, test, integration and packaging of MEMS symposium :. Cannes Mandelieu, France.

De Venuto, D. and Compagne, E. and Richardson, Andrew M. D. (2003) Investigations into testability improvements on a 16 bit audio sigma-delta ADC through the use of on-chip techniques. In: Proceedings of IMSTW 2003 :. UNSPECIFIED.

Rosing, R. and Richardson, Andrew M. D. (2003) Modelling techniques for reliability prediction in MEMS technologies. In: Proceedings of the Nanotech 2003 conference :. UNSPECIFIED.

Jeffrey, C. and Lechner, A. and Richardson, Andrew M. D. (2003) Online monitoring for automotive sub-systems using 1149.4. In: EPRINTS-BOOK-TITLE :. UNSPECIFIED.

Jeffrey, C. and Lechner, A. and Richardson, Andrew M. D. (2003) Re-using IEEE1149.4 as an infrastructure for online monitoring. In: Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03) :. UNSPECIFIED, pp. 247-249.

Burbidge, Martin J. and Tijou, Jim and Poullet, Frederic and Richardson, Andrew M. D. (2002) Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs. In: Proceedings of the Seventh IEEE European Test Workshop, 2002. :. IEEE, pp. 95-102. ISBN 0-7695-1715-3

Lechner, A. and Burbidge, M. J. and Richardson, Andrew M. D. and Hermes, B. (2001) 3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs. In: Proceedings of the 2nd Latin-American test workshop (LATW ’01) :. UNSPECIFIED, pp. 194-199.

Reichenbach, R. and Rosing, R. and Richardson, Andrew M. D. and Dorey, A. P. (2001) Finite element analysis to support component level fault modelling for MEMS. In: Proceedings of SPIE design, test, integration and packaging of MEMS symposium :. UNSPECIFIED, pp. 147-158.

Rosing, R. and Reichenbach, R. and Richardson, Andrew M. D. and Dorey, A. P. (2001) Generation of component level fault models for MEMS. In: Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01) :. UNSPECIFIED, pp. 40-45.

Lechner, A. and Richardson, Andrew M. D. and Hermes, B. (2001) Short circuit faults in state-of-the-art ADCs – are they hard or soft? In: 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, pp. 417-422. ISBN 0769513786 9780769513782

Burbidge, M. and Richardson, Andrew M. D. and Lechner, A. (2001) Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. In: Proceedings of the 7th IEEE international test workshop :. UNSPECIFIED, pp. 97-102.

Lechner, A. and Richardson, Andrew M. D. and Hermes, B. (2001) Towards a better understanding of failure modes and test requirements of ADCs. In: Proceedings of a conference: automation and test in Europe (DATE ’01) :. UNSPECIFIED, p. 803.

Lechner, A. and Richardson, Andrew M. D. and Burbidge, M. and Hermes, B. (2001) A failure mode analysis of a 6-bit folding ADCs. In: Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01) :. UNSPECIFIED, pp. 19-23.