Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.

Burbidge, M. and Lechner, A. and Bell, G. and Richardson, Andrew M. D. (2004) Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops. In: IEE proceedings - circuits, devices and systems. UNSPECIFIED, pp. 337-348.

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Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
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ID Code:
20109
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Deposited On:
10 Dec 2008 14:39
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No
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Published
Last Modified:
25 Jul 2020 06:50