Lechner, A. and Burbidge, Martin J. and Richardson, Andrew M. D. (2004) Flexible embedded test solution for high-speed analogue front-end architectures. IEE Proceedings - Circuits, Devices and Systems, 151 (4). pp. 359-369. ISSN 1350-2409
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Abstract
A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip test evaluation.
Item Type:
Journal Article
Journal or Publication Title:
IEE Proceedings - Circuits, Devices and Systems
Additional Information:
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Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/2200/2208
Subjects:
?? electrical and electronic engineeringta engineering (general). civil engineering (general) ??
Departments:
ID Code:
20121
Deposited By:
Deposited On:
10 Dec 2008 16:56
Refereed?:
No
Published?:
Published
Last Modified:
27 Aug 2024 23:29