Richardson, Andrew M. D. and Mir, S. and Cheng, T. (2006) Guest editorial. Journal of Electronic Testing, 22 (4-6). p. 311. ISSN 0923-8174
Full text not available from this repository.Item Type:
Journal Article
Journal or Publication Title:
Journal of Electronic Testing
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/2200/2208
Subjects:
?? electrical and electronic engineeringta engineering (general). civil engineering (general) ??
Departments:
ID Code:
8205
Deposited By:
Deposited On:
15 Apr 2008 08:43
Refereed?:
Yes
Published?:
Published
Last Modified:
15 Jul 2024 11:30