Short circuit faults in state-of-the-art ADCs – are they hard or soft?

Lechner, A. and Richardson, Andrew M. D. and Hermes, B. (2001) Short circuit faults in state-of-the-art ADCs – are they hard or soft? In: 10th Asian Test Symposium : proceedings. IEEE Computer Society, pp. 417-422. ISBN 0769513786 9780769513782

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Item Type:
Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
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ID Code:
20262
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Deposited On:
22 Dec 2008 13:57
Refereed?:
No
Published?:
Published
Last Modified:
01 Jan 2020 05:18