Burbidge, M. and Richardson, Andrew M. D. and Lechner, A. (2001) Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. In: Proceedings of the 7th IEEE international test workshop :. UNSPECIFIED, pp. 97-102.
Full text not available from this repository.Item Type:
Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
?? ta engineering (general). civil engineering (general) ??
Departments:
ID Code:
20243
Deposited By:
Deposited On:
19 Dec 2008 13:56
Refereed?:
No
Published?:
Published
Last Modified:
16 Jul 2024 01:42