Burbidge, M. and Richardson, Andrew M. D. (2001) Simple digital only test approach for embedded charge-pump phase-locked loops. Electronics Letters, 37 (22). pp. 1318-1319. ISSN 0013-5194
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Abstract
Techniques for a simple automated test approach for high performance fully embedded charge-pump phase-locked loops (CP-PLLs) are explained. The test approach is focused towards non-invasive high volume production testing of PLLs using digital only testers in conjunction with additional on-chip circuitry
Item Type:
Journal Article
Journal or Publication Title:
Electronics Letters
Additional Information:
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Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/2200/2208
Subjects:
?? electrical and electronic engineeringta engineering (general). civil engineering (general) ??
Departments:
ID Code:
20242
Deposited By:
Deposited On:
19 Dec 2008 14:16
Refereed?:
No
Published?:
Published
Last Modified:
27 Aug 2024 23:29