Items where Author is "Tsai, Jaw-Shen"

Im, Hyunsik and Lee, Dong Uk and Jo, Yongcheol and Kim, Jongmin and Chong, Yonuk and Song, Woon and Kim, Hyungsang and Kim, Eun Kyu and Yuk, Taewon and Sin, Sang-Jin and Moon, Soonjae and Prance, Jonathan and Pashkin, Yuri and Tsai, Jaw-Shen (2023) Observation of Kondo condensation in a degenerately doped silicon metal. Nature Physics, 19 (5). pp. 676-681. ISSN 1745-2473

Nakamura, Shuji and Pashkin, Yuri and Taupin, Mathieu and Maisi, Ville F. and Khaymovich, Ivan M. and Mel'nikov, Alexander S. and Peltonen, Joonas T. and Pekola, Jukka P. and Okazaki, Yuma and Kashiwaya, Satoshi and Kawabata, Shiro and Vasenko, Andrey S. and Tsai, Jaw-Shen and Kaneko, Nobu-Hisa (2017) Interplay of the Inverse Proximity Effect and Magnetic Field in Out-of-Equilibrium Single-Electron Devices. Physical Review Applied, 7 (5): 054021.

Nakamura, Shuji and Pashkin, Yuri A. and Tsai, Jaw-Shen and Kaneko, Nobu-hisa (2015) Single-electron pumping by parallel SINIS turnstiles for quantum current standard. IEEE Transactions on Instrumentation and Measurement, 64 (6). pp. 1696-1701. ISSN 0018-9456

Nakamura, Shuji and Pashkin, Yuri and Tsai, Jaw-Shen and Kaneko, Nobu-H. (2014) Temperature dependence of single-electron pumping using a SINIS turnstile. Physica C: Superconductivity and its Applications, 504. pp. 93-96. ISSN 0921-4534

Maisi, Ville F. and Pashkin, Yuri A. and Kafanov, Sergey and Tsai, Jaw-Shen and Pekola, Jukka P. (2009) Parallel pumping of electrons. New Journal of Physics, 11: 113057. -. ISSN 1367-2630

Savin, A. M. and Meschke, M. and Pekola, Jukka P. and Pashkin, Yuri and Li, T. F. and Im, Hyunsik and Tsai, Jaw-Shen (2007) Parity effect in Al and Nb single electron transistors in a tunable environment. Applied Physics Letters, 91 (6): 063512. ISSN 0003-6951

Li, T. F. and Pashkin, Yuri and Astafiev, Oleg V. and Nakamura, Y. and Tsai, Jaw-Shen and Im, Hyunsik (2007) Low-frequency charge noise in suspended aluminum single-electron transistors. Applied Physics Letters, 91 (3): 033107. ISSN 0003-6951

Im, Hyunsik and Pashkin, Yuri and Yamamoto, T. and Astafiev, O. V. and Nakamura, Y. and Tsai, Jaw-Shen (2007) Characterization of all-Nb nanodevices fabricated by electron beam lithography and ion beam oxidation. Journal of Vacuum Science and Technology B, 25 (2): 448. ISSN 1071-1023

Yamamoto, T. and Nakamura, Y. and Pashkin, Yuri and Astafiev, Oleg V. and Tsai, Jaw-Shen (2006) Parity effect in superconducting aluminum single electron transistors with spatial gap profile controlled by film thickness. Applied Physics Letters, 88 (21): 212509. ISSN 0003-6951

Astafiev, Oleg V. and Pashkin, Yuri and Nakamura, Y. and Yamamoto, T. and Tsai, Jaw-Shen (2006) Temperature Square Dependence of the Low Frequency 1=f Charge Noise in the Josephson Junction Qubits. Physical review letters, 96 (13): 137001. ISSN 0031-9007

Im, Hyunsik and Pashkin, Yuri and Yamamoto, T. and Astafiev, Oleg V. and Nakamura, Y. and Tsai, Jaw-Shen (2006) Characterization of ultrasmall all-Nb tunnel junctions with ion gun oxidized barriers. Applied Physics Letters, 88 (11): 112113. ISSN 0003-6951

Pashkin, Yuri and Yamamoto, T. and Astafiev, Oleg V. and Nakamura, Y. and Averin, D. V. and Tilma, T. and Nori, F. and Tsai, Jaw-Shen (2005) Coherent manipulation of coupled Josephson charge qubits. Physica C: Superconductivity and its Applications, 426-43 (2). pp. 1552-1560. ISSN 0921-4534

Astafiev, Oleg V. and Pashkin, Yuri and Nakamura, Y. and Yamamoto, T. and Tsai, Jaw-Shen (2004) Quantum Noise in the Josephson Charge Qubit. Physical review letters, 93 (26): 267007. ISSN 0031-9007

Astafiev, Oleg V. and Pashkin, Yuri and Yamamoto, T. and Nakamura, Y. and Tsai, Jaw-Shen (2004) Single-shot measurement of the Josephson charge qubit. Physical review B, 69 (18): 180507. ISSN 0163-1829

Solin, S. A. and Hines, D. R. and Rowe, A. C. H. and Tsai, Jaw-Shen and Pashkin, Yuri (2003) Nanoscopic magnetic field sensor based on extraordinary magnetoresistance. Journal of Vacuum Science and Technology B, 21 (6). ISSN 1071-1023

Solin, S. A. and Hines, D. R. and Rowe, A. C. H. and Tsai, Jaw-Shen and Pashkin, Yuri and Chung, S. J. and Goel, N. and Santos, M. (2002) Nonmagnetic semiconductors as read-head sensors for ultra-high-density magnetic recording. Applied Physics Letters, 80 (21). pp. 4012-4014. ISSN 0003-6951

Nakamura, Y. and Pashkin, Yuri and Yamamoto, T. and Tsai, Jaw-Shen (2002) Charge Echo in a Cooper-Pair Box. Physical review letters, 88 (4): 047901. ISSN 0031-9007

Solin, S. A. and Hines, D. R. and Tsai, Jaw-Shen and Pashkin, Yuri and Chung, S. J. and Goel, N. and Santos, M. (2002) Room temperature extraordinary magnetoresistance of nonmagnetic narrow-gap semiconductor/metal composites : application to read-head sensors for ultrahigh-density magnetic recording. IEEE Transactions on Magnetics, 38 (1). pp. 89-94. ISSN 0018-9464

Nakamura, Y. and Yamamoto, T. and Tsai, Jaw-Shen and Pashkin, Yuri (2002) Quantum-state manipulation in a Cooper-pair box. In: Foundations of Quantum Mechanics in the Light of New Technology :. World Scientific Publishing, pp. 12-17. ISBN 9789812381309

Nakamura, Y. and Pashkin, Yuri and Tsai, Jaw-Shen (2001) Rabi Oscillations in a Josephson-Junction Charge Two-Level System. Physical review letters, 87 (24): 246601. ISSN 0031-9007

Tsai, Jaw-Shen and Nakamura, Y. and Pashkin, Yuri (2001) Superconducting single-Cooper-pair box as quantum bit. Physica C: Superconductivity and its Applications, 357-36 (4). pp. 1-6. ISSN 0921-4534

Pashkin, Yuri and Nakamura, Y. and Tsai, Jaw-Shen (2000) Room-temperature Al single-electron transistor made by electron-beam lithography. Applied Physics Letters, 76 (16). pp. 2256-2258. ISSN 0003-6951

Pashkin, Yuri A. and Nakamura, Yasunobu and Tsai, Jaw-Shen (1999) Coulomb Blockade in Resistively Coupled Single-Electron Transistor: Dependence on Bias Conditions. Japanese Journal of Applied Physics, 38 (Part 1). pp. 2466-2469. ISSN 0021-4922

Pashkin, Yuri and Nakamura, Y. and Tsai, Jaw-Shen (1999) Metallic resistively coupled single-electron transistor. Applied Physics Letters, 74 (1). pp. 132-134. ISSN 0003-6951