Items where Author is "Richardson, A. M. D."

Al-Gayem, Qais and Liu, Hongyuan and Richardson, A. M. D. and Burd, N. and Kumar, Mukesh (2010) An on-line monitoring technique for electrode degradation in bio-fluidic microsystems. In: Proceedings of the 2010 IEEE International Test Conference (ITC) :. IEEE, Austin, Texas, pp. 1-10. ISBN 978-1-4244-7206-2

Jeffery, C. and Rosing, R. and Richardson, A. M. D. (2000) Applications of mixed signal test strategies to next generation microsystems. In: Design, modeling, and simulation in microelectronics :. SPIE (Society of Photo-Optical Instrumentation Engineers), pp. 21-32. ISBN 0-8194-3900-2.

Richardson, A. M. D. and Lechner, A. (2000) Design-for-testability for mixed signal and analogue design. In: Proceedings of 7th international conference on mixed design of integrated circuits and systems :. UNSPECIFIED, Poland.

Rosing, R. and Lechner, A. and Richardson, A. M. D. and Dorey, A. P. (2000) Fault simulation and modelling of microelectromechanical systems. IEE Journal on Computing and Control Engineering, 11 (5). pp. 242-250.

Jeffery, C. and Rosing, R. and Richardson, A. M. D. (2000) A built-in test solution for a SMART silicon micromachined resonant pressure sensor. In: IEEE European Test Workshop :. IEEE. ISBN 0-7695-0701-8.

Rosing, R. and Richardson, A. M. D. and Dorey, A. P. (2000) A fault simulation methodology for MEMS. In: Proceedings of the design automation and test in Europe conference :. IEEE, Paris, pp. 476-483. ISBN 0-7695-0537-6.

Rosing, R. and Richardson, A. M. D. and Dorey, A. P. (2000) A fault simulation methodology for MEMS. In: Proceedings of the IEE symposium on quality and automation (RESQUA 2000) :. UNSPECIFIED, Penang, Malaysia.

Rosing, R. and Richardson, A. M. D. and Kerkhoff, A. and Acosta, A. (1998) Clock switching : a new design for current test (DcT) method for dynamic logic circuits. In: IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on :. IEEE, pp. 20-25. ISBN 0818691913

Lechner, A. and Richardson, A. M. D. and Hermes, B. and Perkins, A. (1998) Design for testability strategies for a high performance gain control circuit. In: Proceedings of the international IEEE mixed signal test workshop :. The Hague.

Richardson, A. M. D. and Lechner, A. and Olbrich, T. (1998) Design for testability strategies for mixed signal and analogue designs: from layout to system. In: Proceedings of the 5th IEEE international conference on electronics, circuits and systems :. UNSPECIFIED, Lisbon, pp. 425-433.

Prieto, J. and Richardson, A. M. D. and Rueda, A. and Grout, I. (1998) An approach to realistic fault prediction and layout design for testability in analogue circuits. In: Proceedings of the conference on design, automation and test in Europe :. UNSPECIFIED, Paris, pp. 906-912.

Lechner, A. and Richardson, A. M. D. and Hermes, B. and Ohletz, M. (1998) A design for testability study on a high performance automatic gain control circuit. In: Proceedings of the 16th IEEE VLSI test symposium :. IEEE, pp. 376-385.

Sharif, E. and Dorey, A. P. and Richardson, A. M. D. (1998) An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems. In: Proceedings of the IEEE international circuits and systems symposium :. IEEE.

Olbrich, T. and Bradley, D. A. and Richardson, A. M. D. (1996) Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance. Quality Engineering, 8 (4). pp. 601-613. ISSN 1532-4222

Bratt, Adrian and Richardson, A. M. D. and Harvey, Russell and Dorey, A. P. (1995) A design-for-test structure for optimising analogue and mixed signal IC test. In: European Design and Test Conference :. IEEE, pp. 24-33.

Harvey, Russell and Richardson, A. M. D. and Baker, K. and Bruls, E. (1994) Analogue Fault Simulation Based on Layout-Dependent Fault Models. In: Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years :. IEEE Computer Society, Washington, DC, USA, pp. 641-649. ISBN 0-7803-2103-0.

Olbrich, T. and Bradley, D. A. and Richardson, A. M. D. (1994) BIST and diagnostics for microsystems. In: Proceedings of the 7th ISATA conference: dedicated conferences on mechatronics and supercomputing applications in the transportation industries :. Automotive Automation, Croydon, pp. 575-580.

Olbrich, T. and Richardson, A. M. D. and Bradley, D. A. (1994) BIST and diagnostics for safety critical microsystems. In: Proceedings of an ESREF conference :. UNSPECIFIED, Glasgow, pp. 511-518.

Bratt, Adrian and Baker, K. and Richardson, A. M. D. and Welbers, A. (1994) Development of class 1 QTAG monitor. In: Proceedings of an international test conference: the next 25 years :. IEEE Service Centre.

Olbrich, T. and Bradley, D. A. and Richardson, A. M. D. (1994) Self-test and diagnostics for smart sensors in automotive applications. In: Proceedings of the IEE colloquium on automotive sensors :. UNSPECIFIED, 3/1-4.

Bratt, Adrian and Harvey, R. J. A. and Dorey, A. P. and Richardson, A. M. D. (1993) Aspects of current reference generation and distribution for IDDx pass/fail current determination. In: Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240 :. UNSPECIFIED, London.

Bratt, Adrian and Harvey, R. J. A. and Dorey, A. P. and Richardson, A. M. D. (1993) Design-for-test structure to facilitate test vector application with low performance loss in non-test mode. Electronics Letters, 29 (16). pp. 1438-1440. ISSN 1350-911X

Harvey, R. J. A. and Richardson, A. M. D. and Bruls, E. M. J. and Baker, K. (1993) Test evaluation for complex mixed signal ICs by introducing layout dependent faults. In: Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240 :. UNSPECIFIED, London, 6/1-8.

Richardson, A. M. D. and Dorey, A. P. (1992) Reliability indicators. In: Third European symposium of reliability of electron devices, failure, physics and analysis (ESREF) :. Schabisch Gmund, pp. 277-285.

Richardson, A. M. D. and Dorey, A. P. (1992) Supply current monitoring in cmos circuits for reliability prediction and test. Quality and Reliability Engineering International, 8 (6). pp. 543-548. ISSN 1099-1638