A fault simulation methodology for MEMS.
Rosing, R. and Richardson, A. M. D. and Dorey, A. P.
(2000)
A fault simulation methodology for MEMS.
In:
Proceedings of the design automation and test in Europe conference :.
IEEE, Paris, pp. 476-483.
ISBN 0-7695-0537-6.
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Abstract
Efficient built-in and external test strategies are becoming essential in microelectromechanical systems (MEMS), especially for high reliability and safety critical applications. To be realistic however, internal and external test must be properly validated in terms of fault coverage. Fault simulation is hence likely to become a critical utility within the design flow. This paper discuss methods for achieving test support based on the extension of tools and techniques currently being introduced into the mixed signal ASIC market.
Item Type:
Contribution in Book/Report/Proceedings
Additional Information:
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Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
?? ta engineering (general). civil engineering (general) ??
Deposited On:
23 Dec 2008 09:17
Last Modified:
16 Oct 2024 23:20