Test evaluation for complex mixed signal ICs by introducing layout dependent faults.

Harvey, R. J. A. and Richardson, A. M. D. and Bruls, E. M. J. and Baker, K. (1993) Test evaluation for complex mixed signal ICs by introducing layout dependent faults. In: Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. UNSPECIFIED, London, 6/1-8.

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Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
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ID Code:
20629
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Deposited On:
02 Dec 2008 09:08
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No
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Published
Last Modified:
12 Apr 2020 23:23