Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance

Olbrich, T. and Bradley, D. A. and Richardson, A. M. D. (1996) Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance. Quality Engineering, 8 (4). pp. 601-613. ISSN 1532-4222

Full text not available from this repository.

Item Type:

Journal Article

Journal or Publication Title:

Quality Engineering

Uncontrolled Keywords:

/dk/atira/pure/subjectarea/asjc/2200/2209

Subjects:

?? microsystemssmart sensors self-test testability diagnosis qualityindustrial and manufacturing engineeringsafety, risk, reliability and quality ??

Departments:

Faculty of Science and Technology > Engineering

ID Code:

50865

Deposited By:

ep_importer_pure

Deposited On:

08 Nov 2011 11:35

Refereed?:

Yes

Published?:

Published

Last Modified:

15 Jul 2024 12:27

URI:

https://eprints.lancs.ac.uk/id/eprint/50865