Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance

Olbrich, T. and Bradley, D. A. and Richardson, A. M. D. (1996) Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance. Quality Engineering, 8 (4). pp. 601-613. ISSN 1532-4222

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Item Type:
Journal Article
Journal or Publication Title:
Quality Engineering
Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/2200/2213
Subjects:
ID Code:
50865
Deposited By:
Deposited On:
08 Nov 2011 11:35
Refereed?:
Yes
Published?:
Published
Last Modified:
11 Mar 2020 03:19