Items where Author is "Lechner, A."

Lechner, A. and Georgopoulos, K. and Burbidge, M. and Richardson, A. (2006) Investigation into the use of hybrid solutions for high resolution A/D converter testing. Journal of Electronic Testing, 22 (4-6). pp. 359-370. ISSN 0923-8174

Burbidge, M. and Georgopoulos, K. and Lechner, A. and Richardson, A. (2006) Bit-stream manipulation for SD modulator failure mode analysis. In: Proceedings of the 11th IEEE European test symposium. :. UNSPECIFIED.

Georgopoulos, K. and Burbidge, M. and Lechner, A. and Richardson, Andrew M. D. (2005) Behavioural error injection, spectral analysis and error detection for a 4th order single-loop sigma-delta converter using Walsh transforms. In: Proceedings of the ETS workshop on Testing of High Resolution Mixed Signal Interfaces :. UNSPECIFIED.

Georgopoulos, K. and Burbidge, M. and Lechner, A. and Richardson, Andrew M. D. (2005) Investigation into the Use of Alternative Transformation Techniques for High-Resolution A/D Converter Testing. In: Proceedings of the IEEE Mixed Signal Test Workshop :. UNSPECIFIED.

Lechner, A. and Burbidge, Martin J. and Richardson, Andrew M. D. (2004) Flexible embedded test solution for high-speed analogue front-end architectures. IEE Proceedings - Circuits, Devices and Systems, 151 (4). pp. 359-369. ISSN 1350-2409

Burbidge, M. and Lechner, A. and Bell, G. and Richardson, Andrew M. D. (2004) Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops. In: IEE proceedings - circuits, devices and systems :. UNSPECIFIED, pp. 337-348.

Burbidge, Martin J. and Lechner, A. and Richardson, Andrew M. D. (2003) Evaluation and detection of deterministic jitter causes in CP-PLLs due to macro level faults and pre-detection using simple methods. Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). pp. 157-164.

Jeffrey, C. and Lechner, A. and Richardson, Andrew M. D. (2003) Online monitoring for automotive sub-systems using 1149.4. In: EPRINTS-BOOK-TITLE :. UNSPECIFIED.

Jeffrey, C. and Lechner, A. and Richardson, Andrew M. D. (2003) Re-using IEEE1149.4 as an infrastructure for online monitoring. In: Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03) :. UNSPECIFIED, pp. 247-249.

Lechner, A. and Burbidge, M. J. and Richardson, Andrew M. D. and Hermes, B. (2001) 3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs. In: Proceedings of the 2nd Latin-American test workshop (LATW ’01) :. UNSPECIFIED, pp. 194-199.

Lechner, A. and Richardson, Andrew M. D. and Hermes, B. (2001) Short circuit faults in state-of-the-art ADCs – are they hard or soft? In: 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, pp. 417-422. ISBN 0769513786 9780769513782

Burbidge, M. and Richardson, Andrew M. D. and Lechner, A. (2001) Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. In: Proceedings of the 7th IEEE international test workshop :. UNSPECIFIED, pp. 97-102.

Lechner, A. and Richardson, Andrew M. D. and Hermes, B. (2001) Towards a better understanding of failure modes and test requirements of ADCs. In: Proceedings of a conference: automation and test in Europe (DATE ’01) :. UNSPECIFIED, p. 803.

Lechner, A. and Richardson, Andrew M. D. and Burbidge, M. and Hermes, B. (2001) A failure mode analysis of a 6-bit folding ADCs. In: Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01) :. UNSPECIFIED, pp. 19-23.

Richardson, A. M. D. and Lechner, A. (2000) Design-for-testability for mixed signal and analogue design. In: Proceedings of 7th international conference on mixed design of integrated circuits and systems :. UNSPECIFIED, Poland.

Rosing, R. and Lechner, A. and Richardson, A. M. D. and Dorey, A. P. (2000) Fault simulation and modelling of microelectromechanical systems. IEE Journal on Computing and Control Engineering, 11 (5). pp. 242-250.

Lechner, A. and Richardson, A. M. D. and Hermes, B. and Perkins, A. (1998) Design for testability strategies for a high performance gain control circuit. In: Proceedings of the international IEEE mixed signal test workshop :. The Hague.

Richardson, A. M. D. and Lechner, A. and Olbrich, T. (1998) Design for testability strategies for mixed signal and analogue designs: from layout to system. In: Proceedings of the 5th IEEE international conference on electronics, circuits and systems :. UNSPECIFIED, Lisbon, pp. 425-433.

Lechner, A. and Richardson, A. M. D. and Hermes, B. and Ohletz, M. (1998) A design for testability study on a high performance automatic gain control circuit. In: Proceedings of the 16th IEEE VLSI test symposium :. IEEE, pp. 376-385.