Items where Author is "Dorey, A. P."

Journal Article

Rosing, R. and Lechner, A. and Richardson, A. M. D. and Dorey, A. P. (2000) Fault simulation and modelling of microelectromechanical systems. IEE Journal on Computing and Control Engineering, 11 (5). pp. 242-250.

Bradley, D. A. and Walters, R. M. and Dorey, A. P. (2000) A conceptual study for a computer-based tool to support electronics design in a mechatronic environment. Microprocessors and Microsystems, 24 (2). pp. 51-61. ISSN 1872-9436

Grout, I. A. and Burge, S. E. and Dorey, A. P. (1995) The design and testing of a PI controller ASIC. Microprocessors and Microsystems, 19 (1). pp. 15-22. ISSN 1872-9436

Bratt, Adrian and Olbrich, T. and Dorey, A. P. (1994) Class AB cascode current memory cell. Electronics Letters, 30 (22). pp. 1821-1823. ISSN 1350-911X

Dorey, A. P. and Bradley, D. A. (1994) Measurement science and technology - essential fundamentals of mechatronics. Measurement Science and Technology, 5 (12). pp. 1415-1428. ISSN 0957-0233

Bratt, Adrian and Harvey, R. J. A. and Dorey, A. P. and Richardson, A. M. D. (1993) Design-for-test structure to facilitate test vector application with low performance loss in non-test mode. Electronics Letters, 29 (16). pp. 1438-1440. ISSN 1350-911X

Harvey, R. J. A. and Bratt, A. H. and Dorey, A. P. (1993) A review of testing methods for mixed signal ICs. Microelectronics Journal, 24 (6). pp. 663-674.

Richardson, A. M. D. and Dorey, A. P. (1992) Supply current monitoring in cmos circuits for reliability prediction and test. Quality and Reliability Engineering International, 8 (6). pp. 543-548. ISSN 1099-1638

Contribution in Book/Report/Proceedings

Reichenbach, R. and Rosing, R. and Richardson, Andrew M. D. and Dorey, A. P. (2001) Finite element analysis to support component level fault modelling for MEMS. In: Proceedings of SPIE design, test, integration and packaging of MEMS symposium :. UNSPECIFIED, pp. 147-158.

Rosing, R. and Reichenbach, R. and Richardson, Andrew M. D. and Dorey, A. P. (2001) Generation of component level fault models for MEMS. In: Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01) :. UNSPECIFIED, pp. 40-45.

Rosing, R. and Richardson, A. M. D. and Dorey, A. P. (2000) A fault simulation methodology for MEMS. In: Proceedings of the design automation and test in Europe conference :. IEEE, Paris, pp. 476-483. ISBN 0-7695-0537-6.

Rosing, R. and Richardson, A. M. D. and Dorey, A. P. (2000) A fault simulation methodology for MEMS. In: Proceedings of the IEE symposium on quality and automation (RESQUA 2000) :. UNSPECIFIED, Penang, Malaysia.

Sharif, E. and Dorey, A. P. and Richardson, A. M. D. (1998) An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems. In: Proceedings of the IEEE international circuits and systems symposium :. IEEE.

Bratt, Adrian and Richardson, A. M. D. and Harvey, Russell and Dorey, A. P. (1995) A design-for-test structure for optimising analogue and mixed signal IC test. In: European Design and Test Conference :. IEEE, pp. 24-33.

Grout, I. A. and Burge, S. E. and Dorey, A. P. (1994) ASICs for monitoring and controlling electric motors. In: Application Specific Integrated Circuits for Measurement Systems, IEE Colloquium on :. IET Press, 10/1-10/4.

Burge, S. E. and Grout, I. A. and Dorey, A. P. (1994) Application specific integrated circuit implementation of siso control laws. In: Proceedings of the IEE international conference on control '94 :. IEE, London, pp. 1104-1110.

Grout, I. A. and Burge, S. E. and Dorey, A. P. (1994) Application specific integrated circuit processors for discrete-time control. In: Proceedings of the Irish DSP and control colloquium :. UNSPECIFIED, Dubai, pp. 277-282.

Bratt, Adrian and Harvey, R. J. A. and Dorey, A. P. and Richardson, A. M. D. (1993) Aspects of current reference generation and distribution for IDDx pass/fail current determination. In: Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240 :. UNSPECIFIED, London.

Bratt, Adrian and Harvey, R. J. A. and Dorey, A. P. (1992) Analogue behavioural modelling at systems level. In: IEE PG EC10/C11 colloquium on linear analogue circuits and systems :. IEE, 14/1-14/9.

Dorey, A. P. and Bradley, D. A. (1992) Integrating electronics with mechanical engineering. In: 6th conference on teaching electronic engineering in degree courses :. University of Hull, 28.1-28.8.

Tunnicliffe-Wilson, J. C. and Dorey, A. P. (1992) Mathematics in electronic engineering. In: 6th conference on teaching electronic engineering in degree courses :. UNSPECIFIED, Hull, 43/1-43/9.

Richardson, A. M. D. and Dorey, A. P. (1992) Reliability indicators. In: Third European symposium of reliability of electron devices, failure, physics and analysis (ESREF) :. Schabisch Gmund, pp. 277-285.

Bradley, D. A. and Dorey, A. P. and Silvester, P. J. and Adelson, R. M. (1992) An integrated electronic degree scheme - the Lancaster electronics course. In: Innovative teaching in engineering :. Ellis Horwood, London. ISBN 0134576071