Items where Author is "Burbidge, M."

Journal Article

Lechner, A. and Georgopoulos, K. and Burbidge, M. and Richardson, A. (2006) Investigation into the use of hybrid solutions for high resolution A/D converter testing. Journal of Electronic Testing, 22 (4-6). pp. 359-370. ISSN 0923-8174

Burbidge, M. and Richardson, Andrew M. D. (2001) Simple digital only test approach for embedded charge-pump phase-locked loops. Electronics Letters, 37 (22). pp. 1318-1319. ISSN 0013-5194

Contribution in Book/Report/Proceedings

Burbidge, M. and Georgopoulos, K. and Lechner, A. and Richardson, A. (2006) Bit-stream manipulation for SD modulator failure mode analysis. In: Proceedings of the 11th IEEE European test symposium. :. UNSPECIFIED.

Georgopoulos, K. and Burbidge, M. and Lechner, A. and Richardson, Andrew M. D. (2005) Behavioural error injection, spectral analysis and error detection for a 4th order single-loop sigma-delta converter using Walsh transforms. In: Proceedings of the ETS workshop on Testing of High Resolution Mixed Signal Interfaces :. UNSPECIFIED.

Grout, I. and Murphy, J. and Burbidge, M. and Bell, G. and Manners, A. (2005) Development of a remote access facility for a PLL test course. In: Proceedings of the remote experimentation and virtual instrumentation symposium :. UNSPECIFIED.

Georgopoulos, K. and Burbidge, M. and Lechner, A. and Richardson, Andrew M. D. (2005) Investigation into the Use of Alternative Transformation Techniques for High-Resolution A/D Converter Testing. In: Proceedings of the IEEE Mixed Signal Test Workshop :. UNSPECIFIED.

Burbidge, M. and Lechner, A. and Bell, G. and Richardson, Andrew M. D. (2004) Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops. In: IEE proceedings - circuits, devices and systems :. UNSPECIFIED, pp. 337-348.

Burbidge, M. and Richardson, Andrew M. D. and Lechner, A. (2001) Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions. In: Proceedings of the 7th IEEE international test workshop :. UNSPECIFIED, pp. 97-102.

Lechner, A. and Richardson, Andrew M. D. and Burbidge, M. and Hermes, B. (2001) A failure mode analysis of a 6-bit folding ADCs. In: Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01) :. UNSPECIFIED, pp. 19-23.