Items where Author is "Richardson, A"

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Number of items: 8.

Jeffrey, C and Xu, Z and Richardson, A (2005) Bias superposition : an on-line test strategy for a MEMS based conductivity sensor. In: ETS 2005:10th IEEE European Test Symposium, Proceedings :. IEEE COMPUTER SOC, LOS ALAMITOS, pp. 88-93. ISBN 0-7695-2341-2

Kerkhoff, H G and Zhang, X and Liu, H and Richardson, A and Nouet, P and Azais, F (2005) VHDL-AMS fault simulation for testing DNA bio-sensing arrays. In: 2005 IEEE SENSORS :. IEEE, NEW YORK, pp. 1030-1033. ISBN 0-7803-9056-3

Lechner, A and Ferguson, J and Richardson, A and Hermes, B (1999) A digital partial built-in self-test structure for a high performance automatic gain control circuit. In: DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS :. IEEE COMPUTER SOC, LOS ALAMITOS, pp. 232-238. ISBN 0-7695-0078-1

Olbrich, T and Richardson, A and Vermeiren, W and Straube, B (1997) Integrating testability into microsystems. Microsystem Technologies, 3 (2). pp. 72-79. ISSN 0946-7076

Richardson, A and Sharif, E and Betts, W R (1997) Fault-tolerant and self-testable architectures for zero failure electronics. In: AUTOMOTIVE ELECTRONICS - AUTOTECH'97 :. IMechE seminar publication ; 1997-10 . MECHANICAL ENGINEERING PUBL, EDMUNDS, pp. 133-142. ISBN 1860581153 9781860581151

Olbrich, T and Mozuelos, R and Richardson, A and Bracho, S (1996) Design-for-test (DfT) study on a current mode DAC. IEE Proceedings - Circuits, Devices and Systems, 143 (6). pp. 374-379. ISSN 1350-2409

Richardson, A and Dorey, T (1996) Editorial: Mixed signal & analogue IC test technology. IEE Proceedings - Circuits, Devices and Systems, 143 (6). p. 357. ISSN 1350-2409

Olbrich, T and Richardson, A (1996) Design and self-test for switched-current building blocks. IEEE Design and Test of Computers, 13 (2). pp. 10-17. ISSN 0740-7475

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