Editorial: Mixed signal & analogue IC test technology

Richardson, A and Dorey, T (1996) Editorial: Mixed signal & analogue IC test technology. IEE Proceedings - Circuits, Devices and Systems, 143 (6). p. 357. ISSN 1350-2409

Full text not available from this repository.
Item Type: Journal Article
Journal or Publication Title: IEE Proceedings - Circuits, Devices and Systems
Uncontrolled Keywords: /dk/atira/pure/subjectarea/asjc/2200/2208
Subjects:
Departments: Faculty of Science and Technology > Engineering
ID Code: 50460
Deposited By: ep_importer_pure
Deposited On: 20 Oct 2011 15:35
Refereed?: Yes
Published?: Published
Last Modified: 22 Jun 2019 04:27
URI: https://eprints.lancs.ac.uk/id/eprint/50460

Actions (login required)

View Item View Item