Integrating testability into microsystems

Olbrich, T and Richardson, A and Vermeiren, W and Straube, B (1997) Integrating testability into microsystems. Microsystem Technologies, 3 (2). pp. 72-79. ISSN 0946-7076

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Abstract

The integration of sensors and actuators with microelectronics into either compact packages or onto a single silicon die is likely to be of major technological importance over the next decade. These systems are referred to as Microsystems or Micro-Electro-Mechanical-Systems (MEMS). One obstacle to mass-market introduction are difficulties with quality and reliability verification. This paper outlines the difficulties of testing microsystems, shows approaches of test generation and verification transferable from the mixed-signal Integrated-Circuit (IC) domain, and demonstrates an on-line test designed for bridge-type, micromachined accelerometer and pressure sensors [1].

Item Type: Journal Article
Journal or Publication Title: Microsystem Technologies
Uncontrolled Keywords: /dk/atira/pure/subjectarea/asjc/3100/3104
Subjects:
Departments: Faculty of Science and Technology > Engineering
ID Code: 50454
Deposited By: ep_importer_pure
Deposited On: 25 Oct 2011 10:50
Refereed?: Yes
Published?: Published
Last Modified: 30 Sep 2019 16:19
URI: https://eprints.lancs.ac.uk/id/eprint/50454

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