Items where Author is "Olbrich, T."

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Number of items: 9.

Richardson, A. M. D. and Lechner, A. and Olbrich, T. (1998) Design for testability strategies for mixed signal and analogue designs: from layout to system. In: Proceedings of the 5th IEEE international conference on electronics, circuits and systems :. UNSPECIFIED, Lisbon, pp. 425-433.

Olbrich, T. and Grout, I. and Eben Aimine, Y. and Richardson, A. and Contensou, J. (1997) A new methodology for IC product quality estimation. In: Proceedings of the European design and test conference (ED&TC '97) :. IEEE Computer Society Press, Paris. ISBN 0818677864.

Olbrich, T. and Bradley, D. A. and Richardson, A. M. D. (1996) Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance. Quality Engineering, 8 (4). pp. 601-613. ISSN 1532-4222

Olbrich, T. and Perez, J. and Grout, I. and Richardson, A. and Ferrer, C. (1996) Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs. In: Proceedings of the international test conference 1996 :. UNSPECIFIED, Washington DC, pp. 511-520. ISBN 0780335406

Olbrich, T. and Harvey, R.J.A. and Richardson, A.M.D. (1995) AC analysis of time discrete systems. IEE Seminar Digests, 1995 (192). p. 1.

Bratt, Adrian and Olbrich, T. and Dorey, A. P. (1994) Class AB cascode current memory cell. Electronics Letters, 30 (22). pp. 1821-1823. ISSN 1350-911X

Olbrich, T. and Bradley, D. A. and Richardson, A. M. D. (1994) BIST and diagnostics for microsystems. In: Proceedings of the 7th ISATA conference: dedicated conferences on mechatronics and supercomputing applications in the transportation industries :. Automotive Automation, Croydon, pp. 575-580.

Olbrich, T. and Richardson, A. M. D. and Bradley, D. A. (1994) BIST and diagnostics for safety critical microsystems. In: Proceedings of an ESREF conference :. UNSPECIFIED, Glasgow, pp. 511-518.

Olbrich, T. and Bradley, D. A. and Richardson, A. M. D. (1994) Self-test and diagnostics for smart sensors in automotive applications. In: Proceedings of the IEE colloquium on automotive sensors :. UNSPECIFIED, 3/1-4.

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