Items where Author is "Im, Hyunsik"

Im, Hyunsik and Lee, Dong Uk and Jo, Yongcheol and Kim, Jongmin and Chong, Yonuk and Song, Woon and Kim, Hyungsang and Kim, Eun Kyu and Yuk, Taewon and Sin, Sang-Jin and Moon, Soonjae and Prance, Jonathan and Pashkin, Yuri and Tsai, Jaw-Shen (2023) Observation of Kondo condensation in a degenerately doped silicon metal. Nature Physics, 19 (5). pp. 676-681. ISSN 1745-2473

Im, Hyunsik and Pashkin, Yuri and Kim, Yongmin and Li, T. F. and Jung, Kyooho and Astafiev, O. and Tsai, J. S. (2010) Subgap leakage and interface states in superconductor-insulator-superconductor tunnel junctions. Physica C: Superconductivity and its Applications, 470. S832-S833. ISSN 0921-4534

Pashkin, Yuri and Li, Tiefu and Pekola, Jukka and Astafiev, Oleg and Knyazev, Dmitry and Hoehne, Felix and Im, Hyunsik and Nakamura, Yasunobu and Tsai, Jaw Shen (2010) Suspended single-electron transistor as a detector of its nanomechanical motion. In: ICONN 2010 - Proceedings of the 2010 International Conference on Nanoscience and Nanotechnology :. IEEE, AUS, pp. 340-342. ISBN 9781424452613

Jung, Hyuntae and Kim, Yongmin and Jung, Kyooho and Im, Hyunsik and Pashkin, Yuri and Astafiev, O. and Nakamura, Y. and Lee, Hosik and Miyamoto, Y. and Tsai, J. S. (2009) Potential barrier modification and interface states formation in metal-oxide-metal tunnel junctions. Physical review B, 80 (12): 125413. -. ISSN 1098-0121

Hosik, Lee and Jung, Hyuntae and Kim, Yongmin and Jung, Kyooho and Im, Hyunsik and Pashkin, Yuri and Astafiev, O. and Tsai, J. S. and Miyamoto, Yoshiyuki (2009) Evidence for the Potential Barrier Height Reduction in Metal-Oxide-Metal Tunnel Junctions due to the Interface Dependent Metal-Induced-Gap-States. American Physical Society, 2009 APS March Meeting, March 16-20, 2009.

Savin, A. M. and Meschke, M. and Pekola, Jukka P. and Pashkin, Yuri and Li, T. F. and Im, Hyunsik and Tsai, Jaw-Shen (2007) Parity effect in Al and Nb single electron transistors in a tunable environment. Applied Physics Letters, 91 (6): 063512. ISSN 0003-6951

Li, T. F. and Pashkin, Yuri and Astafiev, Oleg V. and Nakamura, Y. and Tsai, Jaw-Shen and Im, Hyunsik (2007) Low-frequency charge noise in suspended aluminum single-electron transistors. Applied Physics Letters, 91 (3): 033107. ISSN 0003-6951

Im, Hyunsik and Pashkin, Yuri and Yamamoto, T. and Astafiev, O. V. and Nakamura, Y. and Tsai, Jaw-Shen (2007) Characterization of all-Nb nanodevices fabricated by electron beam lithography and ion beam oxidation. Journal of Vacuum Science and Technology B, 25 (2): 448. ISSN 1071-1023

Im, Hyunsik and Pashkin, Yuri and Yamamoto, T. and Astafiev, Oleg V. and Nakamura, Y. and Tsai, Jaw-Shen (2006) Characterization of ultrasmall all-Nb tunnel junctions with ion gun oxidized barriers. Applied Physics Letters, 88 (11): 112113. ISSN 0003-6951