Items where Author is "Bratt, Adrian"

Journal Article

Bratt, Adrian and Olbrich, T. and Dorey, A. P. (1994) Class AB cascode current memory cell. Electronics Letters, 30 (22). pp. 1821-1823. ISSN 1350-911X

Bratt, Adrian and Harvey, R. J. A. and Dorey, A. P. and Richardson, A. M. D. (1993) Design-for-test structure to facilitate test vector application with low performance loss in non-test mode. Electronics Letters, 29 (16). pp. 1438-1440. ISSN 1350-911X

Contribution in Book/Report/Proceedings

Bratt, Adrian and Richardson, A. M. D. and Harvey, Russell and Dorey, A. P. (1995) A design-for-test structure for optimising analogue and mixed signal IC test. In: European Design and Test Conference :. IEEE, pp. 24-33.

Bratt, Adrian and Baker, K. and Richardson, A. M. D. and Welbers, A. (1994) Development of class 1 QTAG monitor. In: Proceedings of an international test conference: the next 25 years :. IEEE Service Centre.

Bratt, Adrian and Harvey, R. J. A. and Dorey, A. P. and Richardson, A. M. D. (1993) Aspects of current reference generation and distribution for IDDx pass/fail current determination. In: Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240 :. UNSPECIFIED, London.

Bratt, Adrian and Harvey, R. J. A. and Dorey, A. P. (1992) Analogue behavioural modelling at systems level. In: IEE PG EC10/C11 colloquium on linear analogue circuits and systems :. IEE, 14/1-14/9.

Contribution to Conference

Richardson, Andrew and Bratt, Adrian and Baturone, I and HUERTAS, J L (1995) The application of IDDX test strategies in analogue and mixed signal IC's. In: IEEE International Mixed Signal Test Workshop, 1995-06-20 - 1995-06-22.