Beri, Stefano and McClintock, Peter V E and Mannella, Riccardo (2004) Dynamics importance sampling for the collection of switching events in vertical-cavity surface-emitting lasers. Fluctuation and Noise Letters, 4 (4). pp. 635-641. ISSN 0219-4775
              
Text (DIMSfantextmod)
DIMSfantextmod.pdf - Accepted Version
Available under License Creative Commons Attribution-NonCommercial.
Download (314kB)
          DIMSfantextmod.pdf - Accepted Version
Available under License Creative Commons Attribution-NonCommercial.
Download (314kB)
Abstract
A numerical approach based on dynamic importance sampling (DIMS) is applied to investigate polarization switches in vertical-cavity surface-emitting lasers. A polarization switch is described as an activation process in a two-dimensional nonequilibrium system. DIMS accelerates the simulations and allows access to noise intensities that were previously forbidden, revealing qualitative changes in the shape of the transition paths with noise intensity.
Item Type:
      
        Journal Article
        
        
        
      
    Journal or Publication Title:
          Fluctuation and Noise Letters
        Additional Information:
          Preprint of an article published in Fluctuation and Noise Letters Vol. 04, No. 04, pp. L635-L641 (2004) 10.1142/S0219477504002269 © 2004 World Scientific Publishing Company https://www.worldscientific.com/worldscinet/fnl
        Uncontrolled Keywords:
          /dk/atira/pure/subjectarea/asjc/2600/2600
        Subjects:
          ?? activation processesnonequilibrium systemsnumerical simulationsoptimal trajectoriesvcselgeneral mathematicsmathematics(all) ??
        Departments:
          
        ID Code:
          134580
        Deposited By:
          
        Deposited On:
          22 Jun 2019 09:15
        Refereed?:
          Yes
        Published?:
          Published
        Last Modified:
          19 Sep 2025 13:46
        ![[thumbnail of DIMSfantextmod]](https://eprints.lancs.ac.uk/style/images/fileicons/text.png)
 Altmetric
 Altmetric Altmetric
 Altmetric