Items where Author is "Rosing, R."

Wiegand, T. and Peters, D. and Laur, R. and Rosing, R. and Richardson, A. and Del Sarto, M. and Baldo, L. (2008) Model based design optimization of micromechanical systems, based on the Cosserat theory. In: PROCEEDINGS OF THE 11TH INTERNATIONAL CONFERENCE ON OPTIMIZATION OF ELECTRICAL AND ELECTRONIC EQUIPMENT, VOL I :. IEEE, NEW YORK, pp. 33-38. ISBN 978-1-4244-1544-1

Richardson, Andrew and De Masi, B. and Rosing, R. and Wang, C. (2004) Construction of Nonlinear Dynamic MEMS Component Models Using Cosserat Theory. Analog Integrated Circuits and Signal Processing, 40 (2). pp. 117-130. ISSN 1573-1979

Wang, C. and Richardson, Andrew M. D. and Liu, D. and Rosing, R. and Tucker, R. and De Masi, B. (2003) Construction of nonlinear dynamic MEMS component models using cosserat theory. In: Proceedings of the SPIE design, test, integration and packaging of MEMS symposium :. Cannes Mandelieu, France.

Rosing, R. and Richardson, Andrew M. D. (2003) Modelling techniques for reliability prediction in MEMS technologies. In: Proceedings of the Nanotech 2003 conference :. UNSPECIFIED.

Rosing, R. and Reichenbach, R. and Richardson, A. (2002) Generation of component level fault models for MEMS. Microelectronics Journal, 33 (10). pp. 861-868. ISSN 0026-2692

Reichenbach, R. and Rosing, R. and Richardson, Andrew M. D. and Dorey, A. P. (2001) Finite element analysis to support component level fault modelling for MEMS. In: Proceedings of SPIE design, test, integration and packaging of MEMS symposium :. UNSPECIFIED, pp. 147-158.

Rosing, R. and Reichenbach, R. and Richardson, Andrew M. D. and Dorey, A. P. (2001) Generation of component level fault models for MEMS. In: Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01) :. UNSPECIFIED, pp. 40-45.

Jeffery, C. and Rosing, R. and Richardson, A. M. D. (2000) Applications of mixed signal test strategies to next generation microsystems. In: Design, modeling, and simulation in microelectronics :. SPIE (Society of Photo-Optical Instrumentation Engineers), pp. 21-32. ISBN 0-8194-3900-2.

Rosing, R. and Lechner, A. and Richardson, A. M. D. and Dorey, A. P. (2000) Fault simulation and modelling of microelectromechanical systems. IEE Journal on Computing and Control Engineering, 11 (5). pp. 242-250.

Jeffery, C. and Rosing, R. and Richardson, A. M. D. (2000) A built-in test solution for a SMART silicon micromachined resonant pressure sensor. In: IEEE European Test Workshop :. IEEE. ISBN 0-7695-0701-8.

Rosing, R. and Richardson, A. M. D. and Dorey, A. P. (2000) A fault simulation methodology for MEMS. In: Proceedings of the design automation and test in Europe conference :. IEEE, Paris, pp. 476-483. ISBN 0-7695-0537-6.

Rosing, R. and Richardson, A. M. D. and Dorey, A. P. (2000) A fault simulation methodology for MEMS. In: Proceedings of the IEE symposium on quality and automation (RESQUA 2000) :. UNSPECIFIED, Penang, Malaysia.

Rosing, R. and Richardson, A. and Dorey, A. and Peyton, A. (1999) Fault simulation for MEMS. In: Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on :. UNSPECIFIED, 7/1 -7/6.

Rosing, R. and Richardson, A. M. D. and Kerkhoff, A. and Acosta, A. (1998) Clock switching : a new design for current test (DcT) method for dynamic logic circuits. In: IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on :. IEEE, pp. 20-25. ISBN 0818691913