Items where Author is "Hermes, B."

Lechner, A. and Burbidge, M. J. and Richardson, Andrew M. D. and Hermes, B. (2001) 3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs. In: Proceedings of the 2nd Latin-American test workshop (LATW ’01) :. UNSPECIFIED, pp. 194-199.

Lechner, A. and Richardson, Andrew M. D. and Hermes, B. (2001) Short circuit faults in state-of-the-art ADCs – are they hard or soft? In: 10th Asian Test Symposium : proceedings : 19-21 November, 2001, Kyoto, Japan. IEEE Computer Society, pp. 417-422. ISBN 0769513786 9780769513782

Lechner, A. and Richardson, Andrew M. D. and Hermes, B. (2001) Towards a better understanding of failure modes and test requirements of ADCs. In: Proceedings of a conference: automation and test in Europe (DATE ’01) :. UNSPECIFIED, p. 803.

Lechner, A. and Richardson, Andrew M. D. and Burbidge, M. and Hermes, B. (2001) A failure mode analysis of a 6-bit folding ADCs. In: Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01) :. UNSPECIFIED, pp. 19-23.

Richardson, Andrew and Lechner, Andreas and Hermes, B. (1999) Reconfiguration based built-in self-test for analogue front-end circuits. In: 5th IEEE International Mixed Signal Testing Workshop, 1999-06-15 - 1999-06-18.

Lechner, A. and Richardson, A. M. D. and Hermes, B. and Perkins, A. (1998) Design for testability strategies for a high performance gain control circuit. In: Proceedings of the international IEEE mixed signal test workshop :. The Hague.

Lechner, A. and Richardson, A. M. D. and Hermes, B. and Ohletz, M. (1998) A design for testability study on a high performance automatic gain control circuit. In: Proceedings of the 16th IEEE VLSI test symposium :. IEEE, pp. 376-385.