Resolution degradation of semiconductor detectors due to carrier trapping

Kozorezov, Alexander G. and Wigmore, J. Keith and Owens, A. and den Hartog, R. and Peacock, A. and Al-Jawhari, H. A. (2005) Resolution degradation of semiconductor detectors due to carrier trapping. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 546 (1-2). pp. 209-212. ISSN 0168-9002

Full text not available from this repository.

Abstract

Incomplete charge collection in semiconductor X-ray detectors due to carrier trapping is recognized as an important source of signal broadening. In this paper we show the results of calculations of energy resolution for a TlBr detector using an analytic approach developed in our earlier work in which fluctuations in the distribution of photon absorption sites are related to fluctuations in the collected charge. Using measured values of transport parameters for electrons and holes in the detector material we obtained excellent agreement with experiment in the X-ray energy range 6–660 keV.

Item Type:
Journal Article
Journal or Publication Title:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/qc
Subjects:
?? SEMICONDUCTOR X-RAY DETECTORCARRIER DYNAMICSENERGY RESOLUTIONINSTRUMENTATIONNUCLEAR AND HIGH ENERGY PHYSICSQC PHYSICS ??
ID Code:
9399
Deposited By:
Deposited On:
06 Jun 2008 14:14
Refereed?:
Yes
Published?:
Published
Last Modified:
16 Sep 2023 00:31