Nanoscale 3D-mapping of electrical, thermal and mechanical properties of buried layers and interfaces via functional atomic force microscopy

Kolosov, Oleg Victor (2017) Nanoscale 3D-mapping of electrical, thermal and mechanical properties of buried layers and interfaces via functional atomic force microscopy. In: Bruker SPM conference and users meeting, 2017-10-102017-10-11, Leeds University.

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Item Type:
Contribution to Conference (Speech)
Journal or Publication Title:
Bruker SPM conference and users meeting
ID Code:
88356
Deposited By:
Deposited On:
23 Oct 2017 13:16
Refereed?:
No
Published?:
Published
Last Modified:
17 Oct 2020 07:34