Nanoscale 3D-mapping of electrical, thermal and mechanical properties of buried layers and interfaces via functional atomic force microscopy

Kolosov, Oleg Victor (2017) Nanoscale 3D-mapping of electrical, thermal and mechanical properties of buried layers and interfaces via functional atomic force microscopy. In: Bruker SPM conference and users meeting, 2017-10-102017-10-11, Leeds University.

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Item Type:

Contribution to Conference (Speech)

Journal or Publication Title:

Bruker SPM conference and users meeting

Departments:

Faculty of Science and Technology > Physics

ID Code:

88356

Deposited By:

ep_importer_pure

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