Selecting suitable image dimensions for scanning probe microscopy

Bowen, James and Cheneler, David (2017) Selecting suitable image dimensions for scanning probe microscopy. Surfaces and Interfaces, 9. pp. 133-142.

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Abstract

The use of scanning probe microscopy to acquire topographical information from surfaces with nanoscale features is now a common occurrence in scientific and engineering research. Image sizes can be orders of magnitude greater than the height of the features being analysed, and there is often a trade-off between image quality and acquisition time. This work investigates a commonly encountered problem in nanometrology - how to choose a scan size which is representative of the entire sample. The topographies of a variety of samples are investigated, including metals, polymers, and thin films.

Item Type:

Journal Article

Journal or Publication Title:

Surfaces and Interfaces

Additional Information:

This is the author’s version of a work that was accepted for publication in Surfaces and Interfaces. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Surfaces and Interfaces, 9, 2017 DOI: 10.1016/j.surfin.2017.09.003

Subjects:

?? atomic force microscopyroughnessscanning probe microscopysurfacetopography ??

Departments:

Faculty of Science and Technology > Engineering

ID Code:

87702

Deposited By:

ep_importer_pure

Deposited On:

12 Sep 2017 08:06

Refereed?:

Yes