Measurement of the shot noise in a single-electron transistor

Kafanov, Sergey and Delsing, P. (2009) Measurement of the shot noise in a single-electron transistor. Physical review B, 80 (15): 155320. ISSN 1098-0121

Abstract

We have systematically measured the shot noise in a single-electron transistor (SET) as a function of bias and gate voltages. By embedding a SET in a resonance circuit we have been able to measure its shot noise at the resonance frequency 464 MHz, where the 1/f noise is negligible. We can extract the Fano factor which varies between 0.5 and 1 depending on the amount of Coulomb blockade in the SET, in very good agreement with the theory.