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Interatomic force microscope and sample observing method therefor

YAMANAKA, K (1994) Interatomic force microscope and sample observing method therefor. JP-6323834.

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Abstract

PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.

Item Type:
Patent
Uncontrolled Keywords:
/dk/atira/pure/core/keywords/physics
Subjects:
?? atomic force microscopynonlinearitynanomechanicsnanotechnologyphysicsqc physics ??
?? 30 ??
Departments:
Faculty of Science and Technology > Physics
ID Code:
59435
Deposited By:
ep_importer_pure
Deposited On:
31 Oct 2012 15:15
Refereed?:
No
Published?:
Published
Last Modified:
15 Jul 2024 07:45
URI:
https://eprints.lancs.ac.uk/id/eprint/59435