Freitag, Christopher (2003) High throughput mechanical property testing of materials libraries using fluid, voltage, and piezoelectric. WO 03/019150 A1.
              
PDF (Patent front page, drawing and abstract)
WO03019150A1.pdf - Published Version
Available under License Creative Commons Attribution Non-commercial No Derivatives.
Download (56kB)
          WO03019150A1.pdf - Published Version
Available under License Creative Commons Attribution Non-commercial No Derivatives.
Download (56kB)
Abstract
A method for high throughput mechanical property testing of materials libraries. A suitable system, such as an o automated system 100, is provided. A plurality of samples on a substrate are monito red for their response to a force directed by a Force Application source (FAS) 18, where the force applied is selected from thegroup consisting of a fluid, a voltage, a piezoelectric, and a combination thereof.
Item Type:
      
        Patent
        
        
        
      
    Uncontrolled Keywords:
          /dk/atira/pure/core/keywords/physics
        Subjects:
          ?? high throughput screeningcombinatorial materials discoverypolymersfilmsmechanical propertyparallel measurementsphysicsqc physics ??
?? 36 ??
        ?? 36 ??
Departments:
          
        ID Code:
          58457
        Deposited By:
          
        Deposited On:
          25 Oct 2012 14:38
        Refereed?:
          No
        Published?:
          Published
        Last Modified:
          20 Sep 2025 03:46
         Altmetric
 Altmetric Altmetric
 Altmetric