A microstructural study of transparent metal oxide gas barrier films

Henry, B. M. and Dinelli, F. and Zhao, K. Y. and Grovenor, C. R. M. and Kolosov, Oleg and Briggs, G. Andrew D. and Roberts, A. P. and Kumar, R. S. and Howson, R. P. (1999) A microstructural study of transparent metal oxide gas barrier films. Thin Solid Films, 355-35. pp. 500-505. ISSN 0040-6090

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Abstract

The relationship between the microstructure and the water vapour transmission rates of aluminium oxide and aluminium coatings deposited by magnetron sputtering on polyethylene terephthalate have been investigated. The gas barrier properties of the films have been measured as a function of temperature and a range of techniques used to characterize the coatings including atomic force microscopy, which also provided information on the early growth mechanism. It was found that the Al/PET film showed a better water vapour barrier than the AlOx/PET although the activation energy for water vapour permeation was the same for both. We propose that the interaction of water with the barrier coating plays a significant part in determining the observed gas barrier performance. (C) 1999 Elsevier Science S.A. All rights reserved.

Item Type:
Journal Article
Journal or Publication Title:
Thin Solid Films
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/qc
Subjects:
?? ALUMINUM OXIDEALUMINUM COATING MICROSTRUCTURE GAS BARRIER FILMPHYSICSMATERIALS CHEMISTRYSURFACES AND INTERFACESELECTRONIC, OPTICAL AND MAGNETIC MATERIALSSURFACES, COATINGS AND FILMSMETALS AND ALLOYSQC PHYSICS ??
ID Code:
57434
Deposited By:
Deposited On:
09 Oct 2012 08:35
Refereed?:
Yes
Published?:
Published
Last Modified:
19 Sep 2023 00:54