Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks

Chekanov, A. S. and Low, T. S. and Alli, S. and Kolosov, Oleg and Briggs, Andrew (1996) Microcracks of the thin-film head alumina: ''L'' cracks and ''U'' cracks. IEEE Transactions on Magnetics, 32 (5). pp. 3696-3698. ISSN 0018-9464

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Abstract

Two different types of microcracks in thin film head alumina were observed : cracks initiated at the alumina edges growing toward the head pole tips and cracks initiated at the head pole tip area and growing towards the leading edge of the alumina. Thermally induced cracks may cause degradation of magnetic head read/write performance due to the damage of the pole tip gap or corrosion of the head pole tips. Data from Ultrasonic AFM (UFM) indicate the difference in the subsurface structure of the observed cracks of the alumina.

Item Type:
Journal Article
Journal or Publication Title:
IEEE Transactions on Magnetics
Uncontrolled Keywords:
/dk/atira/pure/core/keywords/physics
Subjects:
?? physicselectronic, optical and magnetic materialselectrical and electronic engineeringqc physics ??
ID Code:
57422
Deposited By:
Deposited On:
07 Oct 2012 15:15
Refereed?:
Yes
Published?:
Published
Last Modified:
15 Jul 2024 13:09