The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality

Richardson, Andrew and Nicholson, Richard (1999) The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality. In: 5th IEEE International Mixed Signal Testing Workshop, 1999-06-151999-06-18.

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Abstract

The neuMOS transistor is a comparatively new device developed in 1991 at Tohoku University, Japan, which is currently showing great promise in the direction of enhanced circuit functionality, particularly in Neural Network applications. In this paper we examine the possibilities of applying the inherent enhanced functionality of the neuMOS transistor to analogue and digital BIST. A novel concept is introduced which can extend existing sw-opamp structures. Finally, potential outgoing quality enhancement in VLSI neuMOS circuits over the CMOS equivalents are considered.

Item Type:
Contribution to Conference (Paper)
Journal or Publication Title:
5th IEEE International Mixed Signal Testing Workshop
ID Code:
51060
Deposited By:
Deposited On:
15 Nov 2011 16:27
Refereed?:
Yes
Published?:
Published
Last Modified:
24 Nov 2020 10:26