Reconfiguration based built-in self-test for analogue front-end circuits

Richardson, Andrew and Lechner, Andreas and Hermes, B. (1999) Reconfiguration based built-in self-test for analogue front-end circuits. In: 5th IEEE International Mixed Signal Testing Workshop, 1999-06-151999-06-18.

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Abstract

Previous work has shown that it is feasible to implement a fully digital test evaluation function to realise partial self-test on an automatic gain control circuit (AGC). This paper extends the technique to INL, DNL, offset & gain error testing of analogue to digital converters (ADC's). It also shows how the same function can be used to test an AGC / ADC pair. An extension to full self-test is also proposed by the on-chip generation of input stimuli through reconfiguration of existing functions.

Item Type:
Contribution to Conference (Paper)
Journal or Publication Title:
5th IEEE International Mixed Signal Testing Workshop
Subjects:
ID Code:
51059
Deposited By:
Deposited On:
15 Nov 2011 16:23
Refereed?:
Yes
Published?:
Published
Last Modified:
05 Jul 2020 00:40