Defect oriented test development based on inductive fault analysis

Richardson, Andrew and Kerkhoff, H G and Harvey, Russell (1995) Defect oriented test development based on inductive fault analysis. In: IEEE International Mixed Signal Test Workshop, 1995-06-201995-06-22.

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Abstract

This paper describes a method of developing a Defect Oriented Test (DOT) strategy by using Inductive Fault Analysis (IFA) and layout dependent fault models extracted from process defect statistics. The results of a quantitative prediction of the effectiveness of several test strategies, such as functional, IDDQ, and a low voltage power supply method, on a current-mode Digital to Analogue Converter are discussed and show that no single test method is superior.

Item Type:
Contribution to Conference (Paper)
Journal or Publication Title:
IEEE International Mixed Signal Test Workshop
Subjects:
ID Code:
51007
Deposited By:
Deposited On:
11 Nov 2011 11:48
Refereed?:
No
Published?:
Published
Last Modified:
11 Jul 2020 01:22