A digital partial built-in self-test structure for a high performance automatic gain control circuit

Lechner, A and Ferguson, J and Richardson, A and Hermes, B (1999) A digital partial built-in self-test structure for a high performance automatic gain control circuit. In: DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS :. IEEE COMPUTER SOC, LOS ALAMITOS, pp. 232-238. ISBN 0-7695-0078-1

Abstract

It is now widely recognised that Design-for-Testability and Built-in Self-Test techniques rc ill be mandatory to meet test and quality specifications in next generation mired signal integrated systems. This paper describes a new digital on-chip post processing function capable of reducing production test time for a high performance automatic gain control circuit by 70%.