Olbrich, T and Grout, I A and Aimine, Y E and Richardson, A M and Contensou, J (1997) A new quality estimation methodology for mixed-signal and analogue ICs. In: European Design and Test Conference, 1997. ED&TC 97. Proceedings :. I E E E, COMPUTER SOC PRESS, LOS ALAMITOS, pp. 573-580. ISBN 0-8186-7786-4
Full text not available from this repository.Abstract
IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a qualify estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the qualify related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.