A new quality estimation methodology for mixed-signal and analogue ICs

Olbrich, T and Grout, I A and Aimine, Y E and Richardson, A M and Contensou, J (1997) A new quality estimation methodology for mixed-signal and analogue ICs. In: European Design and Test Conference, 1997. ED&TC 97. Proceedings :. I E E E, COMPUTER SOC PRESS, LOS ALAMITOS, pp. 573-580. ISBN 0-8186-7786-4

Abstract

IC product quality is commonly described as the faulty device level at shipment and is becoming an increasingly important metric in the Microelectronics Industry. This paper presents and demonstrates a qualify estimation approach based on Inductive Fault Analysis for mixed-signal and analogue ICs, that quantitatively models the qualify related parameters prior to production. It is shown how the approach can be used to optimise the manufacturing test program.