Krier, A. and Sherstnev, V. V. (2003) The influence of melt purification and structure defects on mid-infrared light emitting diodes. . Journal of Physics D: Applied Physics, 36 (13). pp. 1484-1488. ISSN 0022-3727
Full text not available from this repository.Abstract
Mid-infrared light emitting diodes which exhibit more than 7 mW (pulsed) and 0.35 mW dc output power at 3.3 mum and at room temperature have been fabricated by liquid phase epitaxy using Pb as a neutral solvent. Using Pb solution an increase in pulsed output power of between two and three times was obtained compared with InAs light emitting diodes (LEDs) made using rare-earth gettering. The performance improvements were attributed to a reduction in residual carrier concentration arising from the removal of un-intentional donors and structure defects in the InAs active region material. These LEDs are well matched to the CH4 absorption spectrum and potentially could form the basis of a practical infrared CH4 gas sensor.