Weerasekera, Roshan and Grange, M. and Pamunuwa, Dinesh B. and Tenhunen, Hannu (2010) On signalling over through-silicon via (TSV) interconnects in 3-D integrated circuits. In: Design Automation and Test in Europe (DATE) Conference, 2010-01-01.
Abstract
This paper discusses signal integrity (SI) issues and signalling techniques for Through Silicon Via (TSV) interconnects in 3-D Integrated Circuits (ICs). Field-solver extracted parasitics of TSVs have been employed in Spice simulations to investigate the effect of each parasitic component on performance metrics such as delay and crosstalk and identify a reduced-order electrical model that captures all relevant effects. We show that in dense TSV structures voltage-mode (VM) signalling does not lend itself to achieving high data-rates, and that current-mode (CM) signalling is more effective for high throughput signalling as well as jitter reduction. Data rates, energy consumption and coupled noise for the different signalling modes are extracted.