Reid, A. P. and Oates, K. and Potts, W. T. W. (1993) The effect of aluminium coating on elemental signals in X-ray microanalysis. Microscopy Research and Technique, 24 (2). pp. 168-172. ISSN 1059-910X
Full text not available from this repository.Abstract
It has been determined that, in the normal range of aluminium coating thicknesses used to remove charge from non-conducting specimens in the electron microscope, no detectable influence on the elemental signals obtained in X-ray microanalysis is observed. This is in contrast to a previous report (Hopkins et al., J. Electron Microsc. Tech., 18:176-182, 1991) of a reduction in elemental signal with increasing aluminium coating thickness. An explanation of errors in the previous interpretation is provided.