A new methodology for IC product quality estimation.

Olbrich, T. and Grout, I. and Eben Aimine, Y. and Richardson, A. and Contensou, J. (1997) A new methodology for IC product quality estimation. In: Proceedings of the European design and test conference (ED&TC '97). IEEE Computer Society Press, Paris. ISBN 0818677864.

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Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
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ID Code:
20464
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Deposited On:
10 Dec 2008 14:18
Refereed?:
No
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Published
Last Modified:
20 Nov 2020 09:13