A new methodology for IC product quality estimation.

Olbrich, T. and Grout, I. and Eben Aimine, Y. and Richardson, A. and Contensou, J. (1997) A new methodology for IC product quality estimation. In: Proceedings of the European design and test conference (ED&TC '97). IEEE Computer Society Press, Paris. ISBN 0818677864.

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Item Type:
Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
?? TA ENGINEERING (GENERAL). CIVIL ENGINEERING (GENERAL) ??
ID Code:
20464
Deposited By:
Deposited On:
10 Dec 2008 14:18
Refereed?:
No
Published?:
Published
Last Modified:
21 Nov 2022 13:19