3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.

Lechner, A. and Burbidge, M. J. and Richardson, Andrew M. D. and Hermes, B. (2001) 3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs. In: Proceedings of the 2nd Latin-American test workshop (LATW ’01) :. UNSPECIFIED, pp. 194-199.

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Item Type:
Contribution in Book/Report/Proceedings
Uncontrolled Keywords:
/dk/atira/pure/researchoutput/libraryofcongress/ta
Subjects:
?? ta engineering (general). civil engineering (general) ??
ID Code:
20259
Deposited By:
Deposited On:
22 Dec 2008 14:11
Refereed?:
No
Published?:
Published
Last Modified:
16 Jul 2024 01:42