A Stacked Machine and Deep Learning-based Approach for Analysing Electricity Theft in Smart Grids

Khan, Inam Ullah and Javeid, Nadeem and Taylor, C. James and Gamage, Kelum and Ma, Xiandong (2022) A Stacked Machine and Deep Learning-based Approach for Analysing Electricity Theft in Smart Grids. IEEE Transactions on Smart Grid, 13 (2). pp. 1633-1644. ISSN 1949-3053

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Abstract

The role of electricity theft detection (ETD) is critical to maintain cost-efficiency in smart grids. However, existing methods for theft detection can struggle to handle large electricity consumption datasets because of missing values, data variance and nonlinear data relationship problems, and there is a lack of integrated infrastructure for coordinating electricity load data analysis procedures. To help address these problems, a simple yet effective ETD model is developed. Three modules are combined into the proposed model. The first module deploys a combination of data imputation, outlier handling, normalization and class balancing algorithms, to enhance the time series characteristics and generate better quality data for improved training and learning by the classifiers. Three different machine learning (ML) methods, which are uncorrelated and skillful on the problem in different ways, are employed as the base learning model. Finally, a recently developed deep learning approach, namely a temporal convolutional network (TCN), is used to ensemble the outputs of the ML algorithms for improved classification accuracy. Experimental results confirm that the proposed framework yields a highly-accurate, robust classification performance, in comparison to other well-established machine and deep learning models and thus can be a practical tool for electricity theft detection in industrial applications.

Item Type:
Journal Article
Journal or Publication Title:
IEEE Transactions on Smart Grid
Additional Information:
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Uncontrolled Keywords:
/dk/atira/pure/subjectarea/asjc/1700
Subjects:
ID Code:
163632
Deposited By:
Deposited On:
20 Dec 2021 09:45
Refereed?:
Yes
Published?:
Published
Last Modified:
02 Dec 2022 00:51