Origin of C60 surface reconstruction resolved by atomic force microscopy

Forcieri, Leonardo and Taylor, Simon and Moriarty, Philip and Jarvis, Samuel (2021) Origin of C60 surface reconstruction resolved by atomic force microscopy. Physical Review B: Condensed Matter and Materials Physics, 104 (20): 205428. ISSN 1098-0121

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Abstract

Surface adsorption of C 60 affects its chemical and electronic properties. Numerous studies have reported observation of bright and dark fullerenes on metal surfaces that suggest extensive surface reconstruction; however, the underpinning mechanism of the reconstruction remains under debate. Here we report tip-functionalized noncontact atomic force microscope measurements which unambiguously reveal that C 60 fullerenes adsorb with three well-defined adsorption heights on the Cu(111) surface, consistent with theoretical reports of top-layer hollow sites, single-atom vacancies, and surface nanopits. Using single-molecule resolution Δ f ( z ) measurements we identify well-defined adsorption heights specific to each site, confirming the presence of a complex vacancy model for C 60 monolayers on metal surfaces.