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Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy

Kolosov, Oleg and Mucientes, Marta and Forcieri, Leonardo and Jarvis, Samuel (2019) Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy. In: The 22nd International Conference on Non-contact Atomic Force Microscopy, 2019-07-29 - 2019-08-02, University of Regensburg.

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Item Type:
Contribution to Conference (Poster)
Journal or Publication Title:
The 22nd International Conference on Non-contact Atomic Force Microscopy
Departments:
Faculty of Science and Technology > Physics
ID Code:
135736
Deposited By:
ep_importer_pure
Deposited On:
29 Jul 2019 11:20
Refereed?:
Yes
Published?:
Published
Last Modified:
15 Oct 2024 00:35
URI:
https://eprints.lancs.ac.uk/id/eprint/135736