Kolosov, Oleg and Mucientes, Marta and Forcieri, Leonardo and Jarvis, Samuel (2019) Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy. In: The 22nd International Conference on Non-contact Atomic Force Microscopy, 2019-07-29 - 2019-08-02, University of Regensburg.
![[thumbnail of ncAFM2019_3D_KPFM]](https://eprints.lancs.ac.uk/style/images/fileicons/text.png)
Item Type:
Contribution to Conference
(Poster)
Journal or Publication Title:
The 22nd International Conference on Non-contact Atomic Force Microscopy
Departments:
ID Code:
135736
Deposited By:
Deposited On:
29 Jul 2019 11:20
Refereed?:
Yes
Published?:
Published
Last Modified:
15 Oct 2024 00:35