Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy

Kolosov, Oleg and Mucientes, Marta and Forcieri, Leonardo and Jarvis, Samuel (2019) Nanoscale 3D potential mapping in buried semiconductor nanostructures using sideband Kelvin Force Probe Microscopy. In: The 22nd International Conference on Non-contact Atomic Force Microscopy, 2019-07-292019-08-02, University of Regensburg.

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Item Type:
Contribution to Conference (Poster)
Journal or Publication Title:
The 22nd International Conference on Non-contact Atomic Force Microscopy
ID Code:
135736
Deposited By:
Deposited On:
29 Jul 2019 11:20
Refereed?:
Yes
Published?:
Published
Last Modified:
30 Sep 2020 00:00